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A full magnetic characterization of bulk Cr tips has been achieved using spin-polarized scanning tunneling microscopy at low temperature. A detailed bias-dependent study of the spatial magnetic sensitivity on the system of 1.5 monolayers of Fe/W(110) reveals that all magnetic directions in space are sensed over a wide bias range, thereby indicating a canted magnetization direction being a typical feature of bulk Cr tips. Consequently, using Cr as tip material allows any standard scanning tunneling microscope setup to be extended by the spin-polarized mode.