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Bulk Cr tips with full spatial magnetic sensitivity for spin-polarized scanning tunneling microscopy

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4 Author(s)
Schlenhoff, A. ; Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstrasse 11, 20355 Hamburg, Germany ; Krause, S. ; Herzog, G. ; Wiesendanger, R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3474659 

A full magnetic characterization of bulk Cr tips has been achieved using spin-polarized scanning tunneling microscopy at low temperature. A detailed bias-dependent study of the spatial magnetic sensitivity on the system of 1.5 monolayers of Fe/W(110) reveals that all magnetic directions in space are sensed over a wide bias range, thereby indicating a canted magnetization direction being a typical feature of bulk Cr tips. Consequently, using Cr as tip material allows any standard scanning tunneling microscope setup to be extended by the spin-polarized mode.

Published in:
Applied Physics Letters  (Volume:97 ,  Issue: 8 )

Date of Publication: Aug 2010

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