Cart (Loading....) | Create Account
Close category search window

Rate-dependence of the switching field distribution in nanoscale granular magnetic materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hovorka, O. ; CIC nanoGUNE Consolider, Donostia-San Sebastián, 20018, Spain ; Evans, R.F.L. ; Chantrell, R.W. ; Berger, A.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The external field sweep-rate dependence of the intrinsic switching field distribution in perpendicular recording media is investigated. We derive a scaling relationship for switching field distributions at different sweep-rates, which we then validate by means of large-scale kinetic Monte Carlo simulations based on interacting Stoner–Wohlfarth particles. After demonstrating the possible occurrence of large differences between switching field distributions at slow time scales of conventional magnetometry and very fast processes relevant in magnetic recording, we propose a technique for extrapolating between these very different sweep-rates.

Published in:

Applied Physics Letters  (Volume:97 ,  Issue: 6 )

Date of Publication:

Aug 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.