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Total dose hardness assurance techniques for new generation COTS devices

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3 Author(s)
C. I. Lee ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; B. G. Rax ; A. H. Johnston

Hardness assurance techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed more degradation at high dose rate than at low dose rate, which is opposite to the behavior of many other bipolar linear devices. New generation low-power op amps showed more degradation in electrical parameters with total power supply voltage of 3 V than at higher voltages. Minimum operating voltage is an important characterization parameter for newer low-power linear circuit designs

Published in:

IEEE Transactions on Nuclear Science  (Volume:43 ,  Issue: 6 )