Referenced Items are not available for this document.
Hardness assurance techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed more degradation at high dose rate than at low dose rate, which is opposite to the behavior of many other bipolar linear devices. New generation low-power op amps showed more degradation in electrical parameters with total power supply voltage of 3 V than at higher voltages. Minimum operating voltage is an important characterization parameter for newer low-power linear circuit designs
Published in:
Nuclear Science, IEEE Transactions on
(Volume:43
,
Issue:
6
)
Date of Publication: Dec 1996
- Page(s):
- 3145 - 3150
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 5498489
- Digital Object Identifier :
- 10.1109/23.556918
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Dec 1996
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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