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Single event effects in pulse width modulation controllers

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6 Author(s)
Penzin, S.H. ; Aerosp. Corp., El Segundo, CA, USA ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J.
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SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed using both Set-Reset (SR) flip-flops and Toggle (T) flip-flops which are vulnerable to single event upset (SEU) in a radiation environment. Depending on the implementation of the different devices the effect can be significant in spaceflight hardware

Published in:

Nuclear Science, IEEE Transactions on  (Volume:43 ,  Issue: 6 )

Date of Publication:

Dec 1996

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