Close category search window
 

Analysis of small urban spatial expansion based on SLEUTH model: Taking Xinxiang city, Henan province of China as an example

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rui Li ; Coll. of Environ. & Planning, Henan Univ., Kaifeng, China ; Fusheng Guo ; Jiulin Sun ; Min Feng

Based on SLEUTH urban growth model and Technology of GIS and RS, the process of urban growth of Xinxiang City from 1989 to 2009 was simulated, and the process of urban growth from 2010 to 2050 was predicted. The result illuminated that SLEUTH model had a credible accuracy, and it could well describe Xinxiang city's extension to the southeast as a whole during 20-year period. The city's area increased linearly with time and formed an expansion trend in which the downtown area was the main body, and several satellite towns formed a delegation-style development from both east and west sides respectively. It would be helpful to understand the mechanisms of urban growth on theoretic and practice and also provide a theoretical basis for the government to make policy.

Published in:
Geoinformatics, 2010 18th International Conference on

Date of Conference: 18-20 June 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.