Cart (Loading....) | Create Account
Close category search window
 

Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bolchini, C. ; Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy ; Sandionigi, C.

This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology to enable the exploitation of these devices also in space applications, typically characterized by long mission times, where permanent faults become an issue. By starting from a characterization of the radiation effects and aging mechanisms, we define a controller able to classify such faults and consequently to apply the appropriate mitigation strategy.

Published in:

Embedded Systems Letters, IEEE  (Volume:2 ,  Issue: 4 )

Date of Publication:

Dec. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.