By Topic

Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
A. Pasquini ; ENEA, Rome, Italy ; A. N. Crespo ; P. Matrella

This paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP); and 2) the relation between this sensitivity and the testing accuracy for computer software. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models. Measurement and comparison are repeated for various OPs, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP; and 2) this relation depends on the accuracy with which the software system has been tested

Published in:

IEEE Transactions on Reliability  (Volume:45 ,  Issue: 4 )