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Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]

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3 Author(s)
Pasquini, A. ; ENEA, Rome, Italy ; Crespo, A.N. ; Matrella, P.

This paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP); and 2) the relation between this sensitivity and the testing accuracy for computer software. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models. Measurement and comparison are repeated for various OPs, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP; and 2) this relation depends on the accuracy with which the software system has been tested

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Reliability, IEEE Transactions on  (Volume:45 ,  Issue: 4 )