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MIS devices are fabricated on InP using a double-layer dielectric consisting of anodic oxide and PECVD silicon nitride. Two different sets of experiments are conducted using tartaric acid and oxalic acid based AGW electrolyte solutions respectively for growing the anodic oxide layer. Devices having the oxalic acid grown anodic oxide layer exhibit capacitance-voltage (C-V) characteristics close to the ideal and are stable for 7200 s under applied bias conditions. The stability of MIS devices is evaluated by determining the accumulation layer charge density versus time.