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A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element

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4 Author(s)

We propose a Bistable Cross-coupled Dual Modular Redundancy (BCDMR) Flip-Flop to enhance soft-error immunity. It is based on a BISER FF but its bistable cross-coupled structure enhances soft-error immunity without any area, delay and power overhead. We fabricated a 65 nm LSI including 60,480 bit shift registers with the BCDMR and BISER structures. Experimental results using α-particles reveals that the soft-error immunity of the BCDMR is enhanced by 150 × at 160 MHz clock frequency compared with the BISER.

Published in:

VLSI Circuits (VLSIC), 2010 IEEE Symposium on

Date of Conference:

16-18 June 2010