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Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies

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4 Author(s)
Heron, O. ; CEA, LIST, Gif-sur-Yvette, France ; Guilhemsang, J. ; Ventroux, N. ; Giulieri, A.

Advances in DSM technologies have a negative impact on yield and reliability of digital circuits. On-line self-testing is an interesting solution for detecting permanent and intermittent faults in non safety critical and real-time embedded multiprocessors. In this paper, we describe and evaluate three scheduling and allocation policies for on-line self-testing. We show that a policy that periodically applies a test procedure to the different processors in a way that considers idle times, test history of processors and task priorities offers a good trade-off between performance and fault detection probability.

Published in:

On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International

Date of Conference:

5-7 July 2010

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