By Topic

Behavioral Modeling Technique for TID Degradation of Complex Analog Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jagannathan, S. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Herbison, D.R. ; Holman, W.T. ; Massengill, L.W.

A behavioral modeling technique has been developed for creating TID-aware behavioral models of voltage feedback op-amps without the creation of an underlying SPICE micro-model. The model accurately predicts the TID response of board-level designs with a 79X increase in simulation speed when compared to the SPICE model for the example application of a Schmitt trigger oscillator. This behavioral model permits the analysis of op amp characteristic sensitivity on circuit level behaviors. This type of sensitivity analysis can be particularly useful for determining which portion of a circuit is most affected by TID and where to more effectively harden a system against TID degradation.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:57 ,  Issue: 6 )