Close category search window
 

Multi-target tracking in clutter with sequential Monte Carlo methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Liu, B. ; Dept. of Stat. Sci., Duke Univ., Durham, NC, USA ; Ji, C. ; Zhang, Y. ; Hao, C.
more authors

For multi-target tracking (MTT) in the presence of clutters, both issues of state estimation and data association are crucial. This study tackles them jointly by Sequential Monte Carlo methods, a.k.a. particle filters. A number of novel particle algorithms are devised. The first one, which we term Monte-Carlo data association (MCDA), is a direct extension of the classical sequential importance resampling (SIR) algorithm. The second one is called maximum predictive particle filter (MPPF), in which the measurement combination with the maximum predictive likelihood is used to update the estimate of the multi-target's posterior. The third, called proportionally weighting particle filter (PWPF), weights all feasible measurement combinations according to their predictive likelihoods, and uses them proportionally in the importance sampling framework. We demonstrate the efficiency and superiority of our methods over conventional approaches through simulations.

Published in:
Radar, Sonar & Navigation, IET  (Volume:4 ,  Issue: 5 )

Date of Publication: October 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.