The modified extended physical optics method, which assumes the physical optics current property over the entire surface of conducting scatterers, is applied to the inverse problem of target profile imaging. The usefulness of the modified extended physical optics method for the direct backscattering problem is first demonstrated. Then this method is applied to the inverse problem, by introducing the phase factor determined iteratively for the shadowed portion of the target and by performing the Fourier transformation of the backscattered field in the frequency domain. As an example, the inverse profiling of nose-on spheroids, including a sphere, is tested and discussed
Published in:
Antennas and Propagation, IEEE Transactions on
(Volume:38
,
Issue:
6
)
Date of Publication: Jun 1990