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Parametric Mismatch Characterization for Mixed-Signal Technologies

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3 Author(s)
Tuinhout, H. ; Central R&D, NXP Semicond., Eindhoven, Netherlands ; Wils, N. ; Andricciola, P.

Systematic and random parametric mismatches are major performance limiters as well as notorious causes for redesigns of high precision mixed-signal circuits and systems. Therefore, it is extremely important to measure, analyze, interpret, model and document parametric mismatch mechanisms meticulously for mixed-signal technologies. This paper gives an overview of the main requirements and techniques for mismatch characterization of active and passive devices in deep submicron mixed-signal IC technologies.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:45 ,  Issue: 9 )