Cart (Loading....) | Create Account
Close category search window
 

A Novel Low Area Overhead Direct Adaptive Body Bias (D-ABB) Circuit for Die-to-Die and Within-Die Variations Compensation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mostafa, H. ; Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada ; Anis, M. ; Elmasry, M.

A direct adaptive body bias (D-ABB) circuit is proposed in this paper. The D-ABB is used to compensate for die-to-die (D2D) and within-die (WID) parameter variations, and accordingly, improves the circuit yield regarding the speed, the dynamic power, and the leakage power. The D-ABB circuit consists of threshold voltage estimation circuits and direct control of the body bias performed by on-chip direct controller circuits. Circuit level simulation results of a circuit block case study, extracted from a real microprocessor critical path, referring to an industrial hardware-calibrated 65-nm CMOS technology transistor model, are presented. These results show that the proposed D-ABB reduces the standard deviations of the frequency, the dynamic power, and the leakage power by factors of 5.5×, 6.4×, and 4.5×, respectively, when both D2D and WID variations are considered. In addition, in the presented case study, initial total yields of 16.8% and 13% are improved to 100% and 91.4%, respectively. The proposed D-ABB circuit exhibits lower area overhead compared to the other ABB circuits reported in the literature.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:19 ,  Issue: 10 )

Date of Publication:

Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.