Cart (Loading....) | Create Account
Close category search window

The study of code density histogram testing method to high-speed ADC based on DSP

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dijian Xu ; Sch. of Electron. Inf. Eng., ChongQing Univ. of Sci. & Technol., Chongqing, China ; Jun Peng

Code density histogram testing method based on digital signal processor is one of dynamic testing methods of high-speed analog-to digital converters. It can evaluate the performance of high speed ADC accurately and quickly. The theory of Code density histogram testing method is analyzed. A suit of high-speed ADC dynamic testing station based on PC. DSP. and FIFO was built that can be operated easily. Its hardware design and software program were fulfilled and realized dynamic testing using code density histogram testing method to high-speed ADCM80 (S bits). Testing result indicates the dynamic testing station is feasible and operated easily.

Published in:

Intelligent Control and Automation (WCICA), 2010 8th World Congress on

Date of Conference:

7-9 July 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.