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The study of code density histogram testing method to high-speed ADC based on DSP

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2 Author(s)
Dijian Xu ; Sch. of Electron. Inf. Eng., ChongQing Univ. of Sci. & Technol., Chongqing, China ; Jun Peng

Code density histogram testing method based on digital signal processor is one of dynamic testing methods of high-speed analog-to digital converters. It can evaluate the performance of high speed ADC accurately and quickly. The theory of Code density histogram testing method is analyzed. A suit of high-speed ADC dynamic testing station based on PC. DSP. and FIFO was built that can be operated easily. Its hardware design and software program were fulfilled and realized dynamic testing using code density histogram testing method to high-speed ADCM80 (S bits). Testing result indicates the dynamic testing station is feasible and operated easily.

Published in:

Intelligent Control and Automation (WCICA), 2010 8th World Congress on

Date of Conference:

7-9 July 2010

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