Cart (Loading....) | Create Account
Close category search window

Shallow angle beam combining using a broad-band XeF laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Smith, M.J. ; Avco Res. Lab., Everett, MA, USA ; Trainor, Daniel W. ; Duzy, Carolyn

Experiments in which two xenon fluoride laser pump beams (353 nm) were crossed at an angle of 2.5 mrad in a 565-cm-long Raman amplifier containing high-pressure (10-atm) hydrogen are described. Bisecting the angle made by these two pump beams was a seed beam at the vibrational Stokes shifted wavelength of 414 nm. This seed beam was generated from a portion of the pump beam that was split off and brought to focus in a separate Raman seed generator. All three beam paths were adjusted so they arrived in the main Raman amplifier at the same time. For the 1.4-Å (FWHM) xenon fluoride pump radiation this required path offset precision to within 0.2 mm over many meters of optical path. The beam quality of the resulting amplified Stokes beam was determined through shearing interferometry techniques to be near the diffraction limit, whereas the pump beams had significant optical distortion

Published in:

Quantum Electronics, IEEE Journal of  (Volume:26 ,  Issue: 5 )

Date of Publication:

May 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.