By Topic

Efficient multifrequency analysis of fault diagnosis in analog circuits based on large change sensitivity computation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tao Wei ; Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong ; Wong, M.W.T. ; Lee, Y.S.

In this paper we present a method for the optimal selection of test points and the generation of test frequencies. Our method is based on large change sensitivity analysis with element level analysis operating in the frequency domain. The fact that the deviation of individual components can be set to arbitrary value ranging from zero to infinity high fault coverage and enhancement in the overall circuit testability are ensured. The proposed method can diagnose both catastrophic and parametric faults. Our results show that both single and multiple faults can be located within small to medium size circuits. The computation is realized by combining the evaluation before test with a symbolic math package. This combination provides low computational cost and proves to be efficient comparing to conventional fault diagnosis methods

Published in:

Test Symposium, 1996., Proceedings of the Fifth Asian

Date of Conference:

20-22 Nov 1996