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Concurrent error detection and fault location in a fast ATM switch

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2 Author(s)
Yoon-Hwa Choi ; Dept. of Comput. Eng., Hongik Univ., Seoul, South Korea ; Pong-Gyou Lee

In this paper, we present a concurrent error detection and fault location technique for a fast ATM switch. The switch architecture has multiple data and control planes, each of which has an identical banyan topology. Cell headers are routed via the control planes to reserve their routing paths on the data planes. Multiplicity of data planes for enhancing performance is utilized to detect errors and locate faults during normal operation. An efficient algorithm is developed to locate faulty links or switching elements while normal switching operations are being performed. The identified faulty data planes can also be made usable for cell transmission

Published in:

Test Symposium, 1996., Proceedings of the Fifth Asian

Date of Conference:

20-22 Nov 1996