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This paper presents new experimental and modeling evidences that advanced commercial CMOS technologies get intrinsically harder against space radiations with technology downscaling. A 65 nm commercial bulk CMOS process can deliver improved radiation-tolerance without sacrificing electrical performance.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:57
,
Issue:
4
)
Date of Publication: Aug. 2010
- Page(s):
- 2079 - 2088
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 11473448
- Digital Object Identifier :
- 10.1109/TNS.2010.2041790
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 16 August 2010
- Issue Date :
- Aug. 2010
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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