Cart (Loading....) | Create Account
Close category search window
 

Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sleiman, S.B. ; ECE Dept., Ohio State Univ., Columbus, OH, USA ; Akour, A. ; Khalil, W. ; Ismail, M.

A wideband CMOS mm-Wave amplitude detector for on-chip self-test and calibration is presented. The high-conversion-gain detector enables accurate on-chip amplitude measurements and allows for the prediction of key RF parameters. The detector operates across the 60 GHz band and achieves a dynamic range of 0-0.5 V and a sensitivity of -9 V/V. The detector's practical use in mm-wave Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) circuits is demonstrated using a 60 GHz CMOS LNA. Simulation results show that the LNA gain, compression point, and intermodulation distortion are predicted with minimal error. The detector and LNA are built in IBM's 90 nm CMOS technology.

Published in:

Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on

Date of Conference:

1-4 Aug. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.