Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

A model for transient fault propagation considering glitch amplitude and rise-fall time mismatch

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
6 Author(s)
Firouzi, F. ; Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran ; Kiamehr, S. ; Monshizadeh, P. ; Saremi, M.
more authors

Along with decrement in size of nanoelectronic devices, they are more prone to the effects of transient faults. Therefore, investigating the effects of such faults is of great importance. Due to high count of transistors in nanoelectronic devices, performing simulation by HSPICE is a time consuming process. Hence, several mathematical models have been proposed. However, our proposed model is simple while being more precise considering factors such as glitch amplitude and rise-fall time mismatch. The predictions of our model are 98% close to those of HSPICE simulation ones in average.

Published in:

Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on

Date of Conference:

3-4 Aug. 2010