Referenced Items are not available for this document.
A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented. The statistical behavior of the circuits is described as a set of stochastic differential equations rather than estimated by a population of realizations and Gaussian closure approximations are introduced to obtain a closed form of moment equations. Statistical simulation of specific circuits shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for variability and noise analysis of integrated circuits.
Published in:
Circuits and Systems I: Regular Papers, IEEE Transactions on
(Volume:58
,
Issue:
1
)
Date of Publication: Jan. 2011
- Page(s):
- 164 - 175
- ISSN :
- 1549-8328
- INSPEC Accession Number:
- 11727765
- Digital Object Identifier :
- 10.1109/TCSI.2010.2055291
- Product Type:
- Journals & Magazines
- Date of Publication :
- 12 August 2010
- Date of Current Version :
- 30 December 2010
- Issue Date :
- Jan. 2011
- Sponsored by :
- IEEE Circuits and Systems Society
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