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Pulsed device measurements and applications

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4 Author(s)
Scott, J. ; Dept. of Electr. Eng., Sydney Univ., NSW, Australia ; Rathmell, J.G. ; Parker, A. ; Sayed, Mohamed

A pulsed measurement system can provide more than just isothermal characteristic data. An off-the-shelf system can determine rapidly the timing necessary for both pulsed-I-V and pulsed-S-parameter measurements to be isothermal and isodynamic. Instantaneous channel temperature may be determined. Thermal and charge-trapping effects can be separated and time constants measured. Full gain-derivative surfaces can be obtained far more efficiently than by spectral sweep measurements. Characteristics and transient effects following excursions beyond the safe-operating-area and into breakdown may be observed nondestructively

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:44 ,  Issue: 12 )