Cart (Loading....) | Create Account
Close category search window
 

Measurement of resistance ratios with digital voltmeter and DAQ card — A comparison

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Malarić, R. ; Fac. of Electr. Eng. & Comput., Univ. of Zagreb, Zagreb, Croatia ; Hegeduš, H. ; Štambuk, I. ; Mostarac, P.

This paper describes the comparison of the precise digital voltmeters and DAQ cards in measurement of resistance ratios. Recently, 24 bit DAQ cards have emerged as possible measuring instruments that can be used to develop precise measurement methods. They are not as expensive as digital voltmeters, and could replace digital voltmeters in many applications.

Published in:

Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Date of Conference:

13-18 June 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.