IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Precision Electromagnetic Mea ... Help

Verification and uncertainty evaluation of an ac shunt calibration system at power frequencies

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kon, S. ; Nat. Metrol. Inst. of Japan (NMIJ), AIST, Tsukuba, Japan ; Yamada, T. ; Tadokoro, T.

An ac shunt calibration system has been developed at NMIJ. The calibration results were discussed with dc calibration results and the expanded uncertainties (k=2) of the system have been estimated to be less than 3.4 μ Ω/Ω for ac resistance and 8.6 μrad for phase angle.

Published in:
Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Date of Conference: 13-18 June 2010

Page(s):
343 - 344
Print ISBN:
978-1-4244-6795-2
INSPEC Accession Number:
11466351
Conference Location :
Daejeon
Digital Object Identifier :
10.1109/CPEM.2010.5543797
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.