Cart (Loading....) | Create Account
Close category search window

A graph-based approach for robust single-shot structured light

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schmalz, C. ; Siemens AG, CT GTF NDE, Munich, Germany ; Angelopoulou, E.

Structured Light is a well-known method for acquiring 3D surface data. Single-shot methods are restricted to the use of only one pattern, but make it possible to measure even moving objects with simple and compact hardware setups. However, they typically operate at lower resolutions and are less robust than multi-shot approaches. This paper presents an algorithm for decoding images of a scene illuminated by a single-shot color stripe pattern. We solve the correspondence problem using a region adjacency graph, which is explicitly designed for robustness against surface color variations. The algorithm runs in real time on input images of 780 × 580 pixels and can generate up to 105 data points per frame. Our methodology gives accurate 3D data even under adverse conditions, i.e. for highly textured or volume-scattering objects and low contrast illumination. Experimental results demonstrate the improvement over previous methods.

Published in:

Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on

Date of Conference:

13-18 June 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.