By Topic

Planar reactive near-field scanning system at KRISS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Dong-Joon Lee ; Center for Electromagn., Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea ; No-Weon Kang ; Jae-Yong Kwon ; Joo-Gwang Lee
more authors

A photonic-assisted reactive near-field scanner for planar antennas is presented. We, KRISS (Korea Research Institute of Standards and Science), have recently developed electro-optic sensors as all-dielectric electric field probes and utilized them for field imaging of antenna patterns. The performance of our system, as well as calibration of the system drift, are introduced by exploring 4 × 4 patch antenna arrays at the K-band.

Published in:

Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Date of Conference:

13-18 June 2010