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E-T based statistical modeling and compact statistical circuit simulation methodologies

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5 Author(s)
Chen, J.C. ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; Chenming Hu ; Wan, C.-P. ; Bendix, P.
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A new statistical parameter extraction methodology which translates actual process variations into SPICE model parameter variations is presented. This methodology uses E-T data to extract SPICE model parameters and guarantees that its extraction results match measured variations. We have applied this methodology to an industrial 0.5 /spl mu/m process. Excellent, overall I-V curve fit for multiple device geometries is achieved. A compact statistical circuit design technology that improves upon the typical/worst/best case methodology is also presented.

Published in:

Electron Devices Meeting, 1996. IEDM '96., International

Date of Conference:

8-11 Dec. 1996