Close category search window
 

Fast and robust object segmentation with the Integral Linear Classifier

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Aldavert, D. ; Dept. Comput. Sci., Univ. Autonoma de Barcelona, Barcelona, Spain ; Ramisa, A. ; de Mantaras, R.L. ; Toledo, R.

We propose an efficient method, built on the popular Bag of Features approach, that obtains robust multiclass pixel-level object segmentation of an image in less than 500ms, with results comparable or better than most state of the art methods. We introduce the Integral Linear Classifier (ILC), that can readily obtain the classification score for any image sub-window with only 6 additions and 1 product by fusing the accumulation and classification steps in a single operation. In order to design a method as efficient as possible, our building blocks are carefully selected from the quickest in the state of the art. More precisely, we evaluate the performance of three popular local descriptors, that can be very efficiently computed using integral images, and two fast quantization methods: the Hierarchical K-Means, and the Extremely Randomized Forest. Finally, we explore the utility of adding spatial bins to the Bag of Features histograms and that of cascade classifiers to improve the obtained segmentation. Our method is compared to the state of the art in the difficult Graz-02 and PASCAL 2007 Segmentation Challenge datasets.

Published in:
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on

Date of Conference: 13-18 June 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.