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A fine-resolution Time-to-Digital Converter for a 5GS/S ADC

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3 Author(s)
Kenneth A. Townsend ; TRLabs, Schulich School of Engineering, University of Calgary, Calgary, Canada ; Andrew R. Macpherson ; James W. Haslett

This paper presents the architecture of a high-speed time-based Analog-to-Digital Converter (ADC) based on voltage-to-time and time-to-digital conversion. A tunable Time-to-Digital Converter (TDC) that is robust against process variation and suitable for embedding within a 3-bit ADC is discussed and its performance evaluated. Simulation shows that when the TDC is designed in a 90nm CMOS process it is capable of a DNL and INL less than ±0.040L5B and ±0.015LSB, respectively, for 9mW of power consumption at 5GS/s with a 6.25ps resolution.

Published in:

Proceedings of 2010 IEEE International Symposium on Circuits and Systems

Date of Conference:

May 30 2010-June 2 2010