Cart (Loading....) | Create Account
Close category search window
 

Efficient test generation with maximal crosstalk-induced noise using unconstrained aggressor excitation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Eggersgluss, S. ; Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany ; Tille, D. ; Drechsler, R.

The influence of crosstalk noise grows as the feature sizes in modern designs decrease. Crosstalk-induced effects are able to cause major timing violations, especially if multiple aggressors affect certain lines. However, conventional Automatic Test Pattern Generation (ATPG) algorithms for delay test do not consider these effects during test generation. This increases the possibility that chips which passed the testing phase might fail due to crosstalk-induced effects. In this paper, we propose a new efficient ATPG approach for generating delay tests considering crosstalk-induced effects using Boolean Satisfiability (SAT). Previous approaches used a two-step procedure to increase the crosstalk-induced noise. As a result, the search space is highly restricted. In contrast, the proposed approach is able to do test generation and excite multiple aggressors in one step. By this, more aggressor combinations can be found and the generated test potentially induce more crosstalk noise on the victim. In order to maximize the crosstalk-induced effects of the test, an exact branch-and-bound algorithm and a static aggressor ordering heuristic are applied and compared. Experimental results demonstrate the efficiency and effectiveness of the approach.

Published in:

Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on

Date of Conference:

May 30 2010-June 2 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.