By Topic

Analysis and optimization of sequential circuit element to combat single-event timing upsets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hamed Abrishami ; University of Southern California, Department of Electrical Engineering ; Safar Hatami ; Massoud Pedram

This paper presents the analysis and optimization of a flip-flop while considering the effect of energetic particle hits on its setup and hold times. First it is shown that the particle hit tightens the setup and hold timing constraints imposed on the flip-flop. Next it is shown how to size transistors of a clocked master-slave CMOS flip-flop to make it more robust against single-event timing upsets. Experimental results to assess the effectiveness of transistor sizing step are provided and discussed.

Published in:

Proceedings of 2010 IEEE International Symposium on Circuits and Systems

Date of Conference:

May 30 2010-June 2 2010