Electromagnetic modelling and transient simulation of interconnects in high speed VLSI circuits

A new technique is implemented in the method of lines to extract the capacitance and inductance matrices of a multiconductor interconnection embedded in a multilayered lossy dielectric region. Using the concept of equivalent transmission lines the electromagnetic problem is turned into a simple network problem. This technique avoids the problem associated with Green's function in the multilayered region and makes the deduction process almost independent of the number of dielectric layers and conductors. Based on the extracted parameters a bilevel waveform relaxation method is used to compute the transient response of such a system terminated in arbitrary loads