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A statistical approach to the inspection checklist formal synthesis and improvement

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1 Author(s)
Y. Chernak ; 25 Zabriskie St., Hackensack, NJ, USA

Proposes a statistical approach to the formal synthesis and improvement of inspection checklists. The approach is based on defect causal analysis and defect modeling. The defect model is developed using IBM's Orthogonal Defect Classification. A case study describes the steps required and a tool for the implementation. The advantages and disadvantages of both empirical and statistical methods are discussed and compared. It is suggested that a statistical approach should be used in conjunction with the empirical approach. The main advantage of the proposed technique is that it allows us to tune a checklist according to the most recent project experience and to identify optimal checklist items even when a source document does not exist

Published in:

IEEE Transactions on Software Engineering  (Volume:22 ,  Issue: 12 )