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Component failure analysis using Neutron beam test

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4 Author(s)

This paper describes how Neutron beam testing can be used to reproduce and root cause a complex system failure. In this unique case, a memory device failed in the field and is not accessible for several hours, but clears on its own after some finite time of powering down. After close investigation, although we had a hypothesis of failure model and mechanism, customer required evidence of proof. We used neutron beam test technique to duplicate the failure and to validate our model.

Published in:

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

Date of Conference:

5-9 July 2010