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Browse Journals & Magazines > Power Engineering Review, IEEE ...> Volume:PER-5 Issue:1 Help

New Short-Circuit Testing Facilities to Cope With the Recent Development of GIS

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4 Author(s)
Yamamoto, M. ; Toshiba Corporation, Kawasaki, Japan ; Yamashita, S. ; Ikeda, H. ; Yanabu, S.

First Page of the Article

Published in:
Power Engineering Review, IEEE  (Volume:PER-5 ,  Issue: 1 )

Date of Publication: Jan. 1985

Page(s):
40 - 41
ISSN :
0272-1724
Digital Object Identifier :
10.1109/MPER.1985.5528561
Product Type:
Journals & Magazines
Date of Current Version :
29 July 2010
Issue Date :
Jan. 1985
Sponsored by :
IEEE Power & Energy Society

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