By Topic

Improving low-dose X-ray CT images by Weighted Intensity Averaging over Large-scale Neighborhoods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yingsheng Li ; The Laboratory of Image Science and Technology, Southeast University, China ; Yang Chen ; Wufan Chen ; Limin Luo
more authors

How to reduce the radiation dose delivered to the patients is always an important concern since the introduction of computed tomography (CT). With respect to patients' care, the least possible radiation dose is demanded. Though clinically desired, low-dose CT (LDCT) images tend to be severely degraded by quantum noise and artifacts under low dose scan protocols. This paper proposes to improve the LDCT images by Weighted Intensity Averaging over Large-scale Neighborhoods (WIA-LN). In the implementation of the proposed WIA-LN method, the processed pixel intensities are from a selective weighted intensity averaging of the pixels belonging to different organs or attenuation tissues within large-scale neighborhoods. Effective suppression of noise and artifacts in LDCT images without obvious loss of fine anatomic features are realized. In experiment, CT images of different doses from a Siemens CT with 16 detector rows are used. Results validate an excellent performance of the proposed approach in improving clinical LDCT images.

Published in:

Medical Image Analysis and Clinical Applications (MIACA), 2010 International Conference on

Date of Conference:

10-13 June 2010