Cart (Loading....) | Create Account
Close category search window
 

Simulation of high power EMP effects on a cylinder object with openings using FDTD method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xiao Jin-shi ; Coll. of Electron. Eng., Naval Univ. of Eng., Wuhan, China ; Liu Wen-hua ; Zhang Shi-ying ; Zhang Jin-hua

High power electromagnetic pulse (EMP) can easily couple into the inner of targets via lots of slots. To calculate the EMP coupling effects on a cylinder object with openings, the coupling course is simulated using FDTD method in this paper. Gauss pulse and double exponential pulse are selected as the incident pulse source. The coupling EM field strength E inside the object and the current density J on the surface are calculated. Several rules about EMP coupling effects are gotten both in time and frequency domain. The results can help us to understand the damage effects of high power EMP.

Published in:

Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on

Date of Conference:

8-11 May 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.