Cart (Loading....) | Create Account
Close category search window
 

Easily testable PLA-based finite state machines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Devadas, S. ; Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA ; Ma, H.-K.T.

An outline is presented of a synthesis procedure that, beginning from a state transition graph (STG) description of a sequential machine, produces an optimized easily testable programmable logic array (PLA) based logic implementation. Previous approaches to synthesizing easily testable sequential machines have concentrated on the stuck-at-fault model; for PLAs, an extended fault model called the crosspoint fault model has been used. The authors propose a procedure of constrained state assignment and logic optimization which guarantees testability for all combinationally irredundant crosspoint faults in a PLA-based finite-state machine. No direct access to the flip-flops is required. The test sequences to detect these faults can be obtained using combinational test generation techniques alone. This procedure thus represents an alternative to a scan design methodology. Results are presented which show that the area/performance penalties in return for easy testability are small

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 6 )

Date of Publication:

Jun 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.