Cart (Loading....) | Create Account
Close category search window
 

Spherical harmonic analysis based on projection rays for 3D model retrieval

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lin Lin ; School of Mechanical Engineering, Harbin Institute of Technology, Hei Long-jiang, China ; Ding Gang ; Chen Fangyu

With the increasing number of available 3D models, there is an increasing need for reusing them. Many efforts on 3D model retrieval have been addressed. In this paper, a method of projection ray is proposed to overcome the low efficiency of the feature extraction using method of ray. The projection is applied to simplify the 3D intersection between rays and triangular faces into the 2D intersection. So, the workload is reduced and the sampling efficiency is improved. With the method of projection ray, the efficiency of Chebyshev sampling for the spherical harmonic analysis is improved greatly. The Chebyshev sampling of multi-layer spheres is also used to avoid the lost of details of the features. The research uses the Euclidean Distance between the descriptor vectors to measure the similarity of two models. The trial operation of a system based on the technologies in the paper shows that the method is effective for the content-based 3D model retrieval.

Published in:

Technology and Innovation Conference 2009 (ITIC 2009), International

Date of Conference:

12-14 Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.