Cart (Loading....) | Create Account
Close category search window
 

Constrained via minimization for systolic arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Molitor, P. ; Dept. of Comput. Sci., Univ. des Saarlandes, Saarbrucken, West Germany

Due to progress in VLSI technology, algorithm-oriented array architectures such as systolic arrays or bit-slice structures appear to be effective, feasible, and economic. The constrained-via-minimization problem for circuits composed of arrays of identical cells C is discussed. To guarantee identical electrical behavior of all instances of C and to allow further hierarchical processing, it is desirable to handle all instances of C identically. To this end, layer assignments of circuits needing a minimal number of via holes are sought. It is shown that this problem can be solved by embedding C on the torus, i.e. by identifying the northern boundary of C with the southern boundary, and the eastern one with the western one. The time complexity of the proposed algorithm is O(m3C), where mC is the number of routing segments in C

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 5 )

Date of Publication:

May 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.