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Compact HBT modeling: status and challenges

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1 Author(s)
Rudolph, M. ; Brandenburg University of Technology, Cottbus, Germany

HBTs show much better performance compared to their BJT predecessors, but also require enhanced models for reliable circuit design. This talk addresses which enhancements are required and available in state-of-the-art models, namely, accounting for self-heating and bias-dependence of transit-time. Limitations of these models, and thus challenges for future modeling efforts, will also be addressed, like: modeling of large and packaged devices, noise modeling, operation in deep saturation, and operation at and beyond transit frequency.

Published in:

Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International

Date of Conference:

23-28 May 2010

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