Close category search window
 

Truncated Epipolar Line Matching Method Based on Image Rectification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Di Wu ; Dept. of Electron. Inf. Eng., Shenyang Normal Univ., Shenyang, China ; Naiguang Lu ; Peng Sun

We present an efficient method based on image rectification for achieving the feature correspondence between images. The method is comprehensible through a geometric analysis of two rectified views. An important constraint-Truncation Point-is found and largely reduces a search range than the conventional method. The classical normalized cross-correlation is then performed on this search range to locate the correspondence points and tracking is followed further. The experiment demonstrates the considerable improvements obtained by this method as well as the good feature tracking effect.

Published in:
Information and Computing (ICIC), 2010 Third International Conference on  (Volume:3 )

Date of Conference: 4-6 June 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.