Cart (Loading....) | Create Account
Close category search window
 

Mesh Refinement in Eddy Current Testing With Separated T-R Probes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Choua, Y. ; Lab. de Genie Electr. de Paris, UPMC Univ. Paris-Sud, Gif-sur-Yvette, France ; Santandréa, L. ; Le Bihan, Y. ; Marchand, C.

In this paper we are interested in FEM mesh refinement procedure in ECT problems with separated T-R (Transmitter and Receiver probes) probes. Local error estimators used for a posteriori h-type mesh refinement are presented. They are based on the complementarity of the E and H formulations. A new estimator is proposed combining the solutions obtained by feeding alternatively the transmitter and the receiver. This estimator proves to be very accurate compared to classical ones.

Published in:

Magnetics, IEEE Transactions on  (Volume:46 ,  Issue: 8 )

Date of Publication:

Aug. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.