By Topic

Multiple fault diagnosis in crossbar nano-architectures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Farazmand, N. ; Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA ; Tahoori, M.B.

Bottom up self-assembly of nano-crossbars from carbon nano-tubes and semiconductor nano-wires has shown the potential to overcome the limitations of lithographic fabrication of CMOS for further down-scaling. However, very high permanent and transient fault rates necessitates the incorporation of efficient fault tolerance techniques, capable of handling multiple faults. Self repair provides fault tolerance through fault detection, diagnosis and reconfiguration to recover from permanent faults. In this paper, we present a multiple faults diagnosis scheme based on dual rail error checking frameworks for nano-crossbar architectures. The proposed scheme is capable of identifying multiple faulty crosspoints with very low performance and area overheads. The experimental results show that all of the multiple faults are correctly diagnosed.

Published in:

Test Symposium (ETS), 2010 15th IEEE European

Date of Conference:

24-28 May 2010