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Test of embedded analog circuits based on a built-in current sensor

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4 Author(s)
Mozuelos, R. ; Dept. TEISA, Univ. of Cantabria, Santander, Spain ; Lechuga, Y. ; Martínez, M. ; Bracho, S.

This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.

Published in:

Test Symposium (ETS), 2010 15th IEEE European

Date of Conference:

24-28 May 2010