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Small embedded systems are often powered by unreliable power supplies like energy harvesting systems or external power supplies. For secure embedded systems a sudden loss of power can violate data integrity. The power has just to drop when data is written to non-volatile memory. In order to guarantee data integrity, a secure embedded system has to provide an anti-tearing mechanism. In this work we summarize a fast simulation based test method for such mechanisms.
Test Symposium (ETS), 2010 15th IEEE European
Date of Conference: 24-28 May 2010