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Browse Conference Publications > Test Symposium (ETS), 2010 15 ... Help

Fast simulation based testing of anti-tearing mechanisms for small embedded systems

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4 Author(s)
Loinig, J. ; Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria ; Steger, C. ; Weiss, R. ; Haselsteiner, E.

Small embedded systems are often powered by unreliable power supplies like energy harvesting systems or external power supplies. For secure embedded systems a sudden loss of power can violate data integrity. The power has just to drop when data is written to non-volatile memory. In order to guarantee data integrity, a secure embedded system has to provide an anti-tearing mechanism. In this work we summarize a fast simulation based test method for such mechanisms.

Published in:
Test Symposium (ETS), 2010 15th IEEE European

Date of Conference: 24-28 May 2010

Page(s):
242
ISSN :
1530-1877
E-ISBN :
978-1-4244-5833-2
Print ISBN:
978-1-4244-5834-9
INSPEC Accession Number:
11432629
Conference Location :
Praha
Digital Object Identifier :
10.1109/ETSYM.2010.5512751
Product Type:
Conference Publications

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