Cart (Loading....) | Create Account
Close category search window
 

InSAR Deformation Time Series Using an L_{1} -Norm Small-Baseline Approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lauknes, T.R. ; Northern Res. Inst., Tromso (Norut), Tromsø, Norway ; Zebker, H.A. ; Larsen, Y.

Satellite synthetic aperture radar interferometry (InSAR) is an invaluable tool for land displacement monitoring. Improved access to time series of satellite data has led to the development of several innovative multitemporal algorithms. Small baseline (SB) is one such time-series InSAR method, based on combining and inverting a set of unwrapped interferograms for surface displacement. Two-dimensional unwrapping of sparse data sets is a challenging task, and unwrapping errors can lead to incorrectly estimated deformation time series. It is well known that L1-norm is more robust than L2-norm cost function minimization if the data set has a large number of outlying points. In this paper, we present an L1-norm-based SB method using an iteratively reweighted least squares algorithm. We show that the displacement phase of both synthetic data, as well as a real data set that covers the San Francisco Bay area, is recovered more accurately than with L2-norm solutions.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:49 ,  Issue: 1 )

Date of Publication:

Jan. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.