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The formation of clusters in the data analysis of position-sensitive detectors is traditionally based on signal-to-noise ratio thresholds. For detectors with a very low signal-to-noise ratio, e.g., as a result of radiation damage, the total collected charge obtained from the clusters is biased to the greater signal values resulting from the thresholds. In this paper an unbiased method to measure the charge collection of a silicon strip detector in a test beam environment is presented. The method is based on constructing the clusters on test detectors around the impact point of the reference track.